drivers: flash: max32: Add read support with ECC workaround

[ttmut]

The MAX32657 SoC includes an ECC engine capable of correcting single-bit errors. However, when reading from an unwritten flash location, the ECC controller incorrectly detects an error and flips a bit in the 16th byte, causing 0xFF to be read as 0xFD.

This PR introduces a workaround and related fixes to mitigate this issue:

1. Mark storage region as non-cacheable using fixed MPU regions. This ensures ECC metadata is correctly updated whenever flash memory is read, as cached flash content bypasses ECC correction.
2. Relocate flash access functions to SRAM to prevent execution from jumping to a different flash section, which could inadvertently update ECC information.
3. Disable interrupts during flash access to avoid context switches that might lead to unintended ECC updates.
4. Introduce a new flash read function that detects and corrects the bit flip when reading from unwritten flash sections.

These changes improve reliability when interacting with flash memory under ECC protection.

A similar issue can be seen in #80351.

Tests

> west build -p auto -b max32657evkit/max32657 .\tests\drivers\flash\common\ -T drivers.flash.common.default

Before:

*** Booting Zephyr OS build v4.2.0-rc1-759-g87917a10874d ***
Running TESTSUITE flash_driver
===================================================================
START - test_flash_copy
Test will run on device flash_controller@29000
 PASS - test_flash_copy in 0.242 seconds
===================================================================
START - test_flash_erase
Test will run on device flash_controller@29000
i=15:   read_buf[i]=253 expected=255
i=31:   read_buf[i]=253 expected=255
i=47:   read_buf[i]=253 expected=255
...
i=495:  read_buf[i]=253 expected=255
i=511:  read_buf[i]=253 expected=255

    Assertion failed at WEST_TOPDIR/zephyr/tests/drivers/flash/common/src/main.c:318: flash_driver_test_flash_erase: (comparison_result is false)
Write operation failed
 FAIL - test_flash_erase in 0.157 seconds
===================================================================
START - test_flash_fill
Test will run on device flash_controller@29000
 PASS - test_flash_fill in 0.132 seconds
...
START - test_read_unaligned_address
Test will run on device flash_controller@29000
 PASS - test_read_unaligned_address in 0.046 seconds
===================================================================
TESTSUITE flash_driver failed.

------ TESTSUITE SUMMARY START ------

SUITE FAIL -  83.33% [flash_driver]: pass = 5, fail = 1, skip = 1, total = 7 duration = 0.754 seconds
 - PASS - [flash_driver.test_flash_copy] duration = 0.242 seconds
 - FAIL - [flash_driver.test_flash_erase] duration = 0.157 seconds
 - PASS - [flash_driver.test_flash_fill] duration = 0.132 seconds
 - PASS - [flash_driver.test_flash_flatten] duration = 0.132 seconds
 - PASS - [flash_driver.test_flash_page_layout] duration = 0.025 seconds
 - SKIP - [flash_driver.test_get_size] duration = 0.020 seconds
 - PASS - [flash_driver.test_read_unaligned_address] duration = 0.046 seconds

------ TESTSUITE SUMMARY END ------

===================================================================
PROJECT EXECUTION FAILED

After:

*** Booting Zephyr OS build v4.2.0-rc1-765-g7abd4d0e463e ***
Running TESTSUITE flash_driver
===================================================================
START - test_flash_copy
Test will run on device flash_controller@29000
 PASS - test_flash_copy in 0.239 seconds
===================================================================
START - test_flash_erase
Test will run on device flash_controller@29000
 PASS - test_flash_erase in 0.042 seconds
===================================================================
START - test_flash_fill
Test will run on device flash_controller@29000
 PASS - test_flash_fill in 0.131 seconds
===================================================================
START - test_flash_flatten
Test will run on device flash_controller@29000
 PASS - test_flash_flatten in 0.131 seconds
===================================================================
START - test_flash_page_layout
Test will run on device flash_controller@29000
start_offset=0xf0000    size=8192       index=120
page_count=128
 PASS - test_flash_page_layout in 0.025 seconds
===================================================================
START - test_get_size
Test will run on device flash_controller@29000
 SKIP - test_get_size in 0.005 seconds
===================================================================
START - test_read_unaligned_address
Test will run on device flash_controller@29000
 PASS - test_read_unaligned_address in 0.047 seconds
===================================================================
TESTSUITE flash_driver succeeded

------ TESTSUITE SUMMARY START ------

SUITE PASS - 100.00% [flash_driver]: pass = 6, fail = 0, skip = 1, total = 7 duration = 0.620 seconds
 - PASS - [flash_driver.test_flash_copy] duration = 0.239 seconds
 - PASS - [flash_driver.test_flash_erase] duration = 0.042 seconds
 - PASS - [flash_driver.test_flash_fill] duration = 0.131 seconds
 - PASS - [flash_driver.test_flash_flatten] duration = 0.131 seconds
 - PASS - [flash_driver.test_flash_page_layout] duration = 0.025 seconds
 - SKIP - [flash_driver.test_get_size] duration = 0.005 seconds
 - PASS - [flash_driver.test_read_unaligned_address] duration = 0.047 seconds

------ TESTSUITE SUMMARY END ------

===================================================================
PROJECT EXECUTION SUCCESSFUL

[github-actions]

The following west manifest projects have changed revision in this Pull Request:

Name	Old Revision	New Revision	Diff
hal_adi	zephyrproject-rtos/hal_adi@16829b7	zephyrproject-rtos/hal_adi@d2886b8 (main)	zephyrproject-rtos/hal_adi@16829b77..d2886b8b

✅ All manifest checks OK

Note: This message is automatically posted and updated by the Manifest GitHub Action.

[sonarqubecloud]

Quality Gate passed

Issues
1 New issue
0 Accepted issues

Measures
0 Security Hotspots
0.0% Coverage on New Code
0.0% Duplication on New Code

See analysis details on SonarQube Cloud