Implement Focus Map & Global Z-Offset Correction System for Automatic Sample Tilt Compensation #169
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This PR implements a comprehensive focus map system that automatically compensates for sample tilt and stage non-planarity during experiments by applying Z-offset corrections based on XY position.
Overview
The focus map system enables automatic focus correction across large scanning areas by:
Key Components
FocusLockManager
Configuration System
API Integration
ExperimentController Integration
Usage Example
Testing
Backward Compatibility
The implementation maintains full backward compatibility with existing focus lock functionality. When hardware is unavailable, the system gracefully falls back to mock behavior, allowing continued development and testing.
Configuration
Example focus map configuration:
This system provides automatic focus correction that is essential for high-quality imaging across large sample areas, particularly beneficial for tiling experiments and samples with significant tilt.
Fixes #168.
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